مبدل‏ های پل فعال دوگانه سه فازی و تحمل پذیری خطا
ترجمه نشده

مبدل‏ های پل فعال دوگانه سه فازی و تحمل پذیری خطا

عنوان فارسی مقاله: یک استراتژی تحمل پذیری خطا برای مبدل‏ های پل فعال دوگانه سه فازی
عنوان انگلیسی مقاله: A Fault-Tolerant Strategy for Three-Phase Dual Active Bridge Converter
مجله/کنفرانس: دهمین کنفرانس بین المللی الکترونیک قدرت، سیستم های درایو و فن آوری ها - ۱۰th International Power Electronics, Drive Systems and Technologies Conference
رشته های تحصیلی مرتبط: برق، کامپیوتر
گرایش های تحصیلی مرتبط: الکترونیک، الکترونیک قدرت، انتقال و توزیع، سیستم های قدرت
کلمات کلیدی فارسی: مبدل های تحمل پذیری خطا، ترانزیستور عیب مدار باز، تشخیص خطا، مبدل پل فعال دوگانه
کلمات کلیدی انگلیسی: Fault-Tolerant Converters، Transistor Open Circuit Fault، Fault-Diagnosis، Dual Active Bridge Converter
شناسه دیجیتال (DOI): https://doi.org/10.1109/PEDSTC.2019.8697835
دانشگاه: Department of Electrical Engineering Sharif University of Technology Tehran, Iran
ناشر: آی تریپل ای - IEEE
نوع ارائه مقاله: کنفرانس
نوع مقاله: ISI
سال انتشار مقاله: 2019
فرمت مقاله انگلیسی: PDF
تعداد صفحات مقاله انگلیسی: 6
وضعیت ترجمه: ترجمه نشده است
قیمت مقاله انگلیسی: رایگان
آیا این مقاله بیس است: خیر
آیا این مقاله مدل مفهومی دارد: ندارد
آیا این مقاله پرسشنامه دارد: ندارد
آیا این مقاله متغیر دارد: ندارد
کد محصول: E13313
رفرنس: دارای رفرنس در داخل متن و انتهای مقاله
فهرست انگلیسی مطالب

Abstract


I- Introduction


II- Principle of Operation


III- Open-Circuit Fault Analysis


IV- Fault-Diagnosis and Post-Fault Operation


V- Simulation Results


VI- Conclusion


References

نمونه متن انگلیسی مقاله

Abstract


Due to several advantages, three-phase Dual Active Bridge (DAB) converter is widely used in numerous applications nowadays. On the other hand, this converter is very vulnerable to Transistor Open-Circuit Fault (TOCF). Therefore, a faulttolerant (FT) scheme has been proposed in this paper to solve the problem. First, normal and faulty conditions are investigated, and according to the results, a fault-diagnosis (FD) approach is introduced. Using the outcomes of FD unit, a new post-fault strategy is proposed for the converter. The FD method is based on the DC component of transformer phase currents, and the basis of FT technique is shedding the faulty phase. Some benefits of the proposed scheme are preventing the shut-down of the system, no overvoltage or overcurrent, no additional power components, and insensitivity to operational conditions. Simulation results are also provided to confirm the analyses, and evaluate the performance of the proposed scheme.


INTRODUCTION


Power electronic converters are used in many industries such as renewable energy systems, transportation, and aerospace. All these industries are striving to improve the reliability of the systems with cost-effective solutions. Additionally, apart from the human safety risks, failures in converters may lead to economic loss as a result of stoppage of the system as well as maintenance costs. As a solution for the problem, Fault-Tolerant (FT) converters have been proposed and become a wide research area in recent literature [1]. FT converters are proposed for a variety of applications, including an AC-AC converter [2], a multi-level converter in [3] and a quasi-Z-source inverter in [4]. Fault-Diagnosis (FD) techniques are the main part of the FT converters, which usually can identify the location of the fault [5]. Many FD methods are proposed for semiconductor faults [1]. Generally, after the detection of the fault, several post-fault strategies can be employed to guarantee the continuity of system operation in spite of the failure. Some of these strategies are as follows: redundancy, reconfiguration, and soft shutdown. Furthermore, according to a survey about failed power converters, the most vulnerable components of a converter are power semiconductors. It is important to note that semiconductor faults account for 31% of failures in converter systems [1]. These faults are categorized into two main groups, including, short-circuit (SC) and open-circuit (OC) faults [1]. If not dealt with properly, both types can lead to serious damages. Typically, sufficient mechanisms are embedded in gate-drivers and power converters for SC protection. Unlike the SC fault, an OC fault usually remains undetected for a long time, deteriorating the performance of the system and can damage all the components. In addition, an OC fault in a power converter can occur as a result of the switch failure or a driver breakdown and it accounts for a large percent of semiconductor failures [6]. In addition, Dual Active Bridge (DAB), thanks to its numerous advantages, is extensively used in numerous applications. This converter has the benefits of high-power density, bidirectional power transfer, galvanic isolation, and so forth. All these benefits have paved the way for the usage of DAB in several applications, namely, electric vehicle, highfrequency-link power conversion systems, and battery storage systems[7]. Additionally, three-phase topology of the converter is usually preferred, in terms of efficiency and power-density, in industrial applications [8]. Having a large number of power semiconductors besides the corresponding gate-drivers, has made three-phase DAB seriously vulnerable to the power semiconductor failure. Even if a TOCF occurs in only one transistor of the converter, damage to other components, including 11 healthy switches, and the shutdown of the system will be unavoidable. Therefore, devising FD and FT techniques for this converter is necessary, in order to mitigate the consequence of TOCF and ensure the service continuity. In [9], faults on DC buses are investigated and techniques for tackling this problem is proposed.

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